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Research in "Bioanalytic using TOF-SIMS"

By using Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) it is possible to obtain chemical information of biological samples with a high lateral resolution. Within the Sonderforschungsbereich TRR79 we investigate different questions concerning the incorpoartion behaviour of new implant materials for osteoporosis patients. We are interested in the Investigation of bone cross sections and in the cell-implant interaction.

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