Research Group of Dr. Anja Henss
Welcome to the Research Group of Dr. Anja Henss!
Our group works in the field of instrumental material and surface analysis and mainly uses secondary ion mass spectrometry (ToF- and Hybrid- SIMS), X-ray photoelectron spectroscopy (XPS) and also Focused Ion Beam Electron Microscopy (FIB-REM) to investigate the properties of energy storage materials. In addition, we also use ToF-SIMS as a classical method from the material sciences in the field of life sciences. Therefore, there are links to medicine, botany and soil science.
Dr. Anja Henss
Department of Physical Chemistry
Phone: +49 641 99 34515
Phone: +49 641 99 34501 (secretary)
Fax: +49 641 99 34509
Installation of the new HybridSIMS