Inhaltspezifische Aktionen

01/2025 Low temperature multimode atomic force microscopy using an active MEMS cantilever


Image: Michael Ruppert
Low temperature atomic force microscopy is routinely performed using qPlus tuning fork sensors. Here, we demonstrate that a piezoelectric MEMS cantilever can achieve higher contrast in AFM frequency shift images at high imaging speeds compared to qPlus sensors.

Original publication:

Michael G. Ruppert, Miguel Wiche, André Schirmeisen and Daniel Ebeling

Nanoscale 2025, 17, 10600-10608

https://doi.org/10.1039/D4NR04169K