Bond imaging of 3D structures with density feedback
Atomic force microscopy (AFM) is one of the most important techniques for the surface analysis. Nanostructure at surfaces as well as molecules adsorbed on surfaces can be mapped with high resolution by means of functionalized AFM tips, delivering information about morphology and even chemical bonds. In most cases the AFM tip is kept at a constant height above the surface during the measurement. While this approach yields detailed images of flat molecules, corrugated systems or bent molecules are not mapped in their entirety. To overcome this issue, a feedback loop can be implemented to perform constant current AFM imaging. We have implemented this approach within the probe-particle method for simulated AFM images. It becomes thus possible to reproduce and even predict the constant-current AFM images. We demonstrate this, among other on the 6F-pentacene molecules in the image below.
The Image of the Month illustrates 6F-pentacene molecules adsorbed on a Cu(111) surface and a CO functionalized AFM tip performing the AFM scans.
Dieses Bild wurde eingereicht von Dr. Marvin Krenz (AG Sanna).
Weitere Einblicke in die Arbeiten der am ZfM beteiligten Arbeitsgruppen finden sie in der Galerie der Bilder des Monats.
