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Schirmeisen, André

Atomic Force Microscopy, Nanotribology and Ion Conduction

The main part of our research is focused on the development and application of scanning probe microscopy methods to nanoscale material analysis. Investigated material classes include organic molecules on surface for 2D chemistry, tribologically active surfaces and energy storage interfaces. On-site method development encompasses dedicated probe engineering, molecular manipulation strategies, field ion microscopy, tip-enhanced Raman scattering set-up (TERS) and liquid cell AFM. Enabling technology activities include development of novel pulse tube cryocoolers, and their adaptation to sub 4K cooling of scientific instruments.

 

Contact

Prof. Dr. André Schirmeisen

Institute of Applied Physics

Phone: +49-641-99-33411
Fax: +49-641-99-33409

Physics building, Heinrich-Buff-Ring 16, Room 137

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Applications/Functionalities:

  • Materials for Space Applications
  • Surface Technologies
  • Organic Electronics

 

Methods:

  • Electrochemical Measurements
  • Surface Analytics
  • Scanning Probe Methods

 

Classes of Materials:

  • Thin Films
  • Solid Electrolytes / mixed Conductors
  • Carbon Materials
  • Molecular Materials
  • Nanomaterials
  • Organic Materials