Major investment: Expansion of the TOF-SIMS by a FIB and an argon cluster source
At the end of 2014 our ToF-SIMS got a major upgrade by installation of a Focused Ion Beam (FIB) source and an argon cluster ion source. This upgrade was funded by the University and will open up excellent new analytical opportunities. The FIB source allows to cut samples within the SIMS chamber with an ion beam, and the argon cluster source allows depth profiling with very low damage to analysed soft materials.
Further information: