Atomic Force Microscope (AFM) for Measurements in Air
Platform:
Scanning Probe Methods (Sonde)
Location:
Physics Building, Heinrich-Buff-Ring 16, room 305 (3rd floor)
Type, properties, other information:
for measurements in air with Peak Force TUNA Mode with Conductive AFM for measuring surface conductivity (type MultiMode 8 SPM from Bruker)
Person in Charge:
Dr. Matthias Elm
Center for Materials Research
Physics building, Heinrich-Buff-Ring 16, Room 329
Phone +49-641-99-33132