Scanning Probe Methods (Sonde)

The method platform Sonde is used for the characterization of surfaces and interfaces by means of atomic force microscopy. The platform is operated by several research groups from the Institute of Applied Physics and the Institute of Experimental Physics I (groups Prof. Schirmeisen, Prof. Schlettwein, Dr. Elm) and provides a variety of scanning probe analysis methods.
In addition to surface topography, nano- and electro-mechanical properties, surface conductivities and electrochemical processes can be investigated.
With the existing equipment and the associated expertise in the working groups supporting the platform, measurement capabilities are available for a variety of atomic force microscopy issues under ambient conditions ranging from liquids to controlled gas atmospheres and ambient air to high vacuum.

Please find the usage regulations (in German) here.

The following equipment is available: