Atomic Force Microscope (AFM) with High Vacuum
Platform:
Scanning Probe Methods (Sonde)
Location:
Physics Building, Heinrich-Buff-Ring 14, room 43 (ground floor)
Type, properties, other information:
for measurements under high vacuum typical for KPFM (Kelvin probe force microscopy), if necessary after sample transfer without vacuum interruption (type Vacuscope 1000 from AIST-NT)
Person in Charge:
Prof. Dr. Derck Schlettwein
Institute of Applied Physics
Physics building, Heinrich-Buff-Ring 16, Room 139
Phone +49-641-99-33401