Atomic Force Microscope (AFM) with High Vacuum

Research Group in Charge:

Prof. Dr. Derck Schlettwein

Platform:

Scanning Probe Methods (Sonde)

Location:

Physics Building, Heinrich-Buff-Ring 14, room 43 (ground floor)

Type, properties, other information:

for measurements under high vacuum typical for KPFM (Kelvin probe force microscopy), if necessary after sample transfer without vacuum interruption (type Vacuscope 1000 from AIST-NT)

Person in Charge:

Prof. Dr. Derck Schlettwein

Institute of Applied Physics

Physics building, Heinrich-Buff-Ring 16, Room 139

Phone +49-641-99-33401

e-Mail