List of all devices https://www.uni-giessen.de/en/faculties/research-centers/materials/platt/list-of-all-devices https://www.uni-giessen.de/@@site-logo/logo.png Document Actions List of all devices Collection all devices 3D Microlithography 3D Printer ORD Solutions 3D Printer Ultimaker Absolute Photoluminescence Absorption Spectrometer UV-VIS Atomic Force Microscope (AFM) with High Vacuum Atomic Force Microscope (AFM) in Glovebox Atomic Force Microscope (AFM) for Measurements in Air Atomic Force Microscope (AFM) for Measurements in Air or Liquids Atomic Layer Deposition (ALD) Atomic-Force Microscope Autotitrator Battery Cycling Systems Climate Test Chamber Cluster-induced Desorption/Ionization Mass Spectrometry Confocal Laser Microscope Contact Angle Gauge Continous-Wave Photoluminescence Deposition of Organic Thin Films Diode-Array Spectrometer with Optical-Fibre Coupling Dip Coater Electron Spin Resonance Spectrometry Electron-Beam Lithography (EBL) Electron-Gun Vapor Deposition Electron-Spin Resonance (ESR) Electrospinning Chambers Elemental Analysis (CHN) Emission Spectroscopy Etching Station for Tunneling Tips Field-Emission Scanning Electron-Microscopy Field-Emission Scanning Electron-Microscopy (MiNaLab) Field-Ion Microscope for Characterization of Tunneling Tips Fluorescence Spectrometer Gas Chromatography Flame-Ionization Detector (GC-FID) Gas Chromatography Mass Spectrometry (GC-MS) Gas Sensor Setup Glovebox Glovebox with Oven Hall Analyzer High-Performance Liquid Chromatography (HPLC) High-Performance Liquid Chromatography (HPLC) High-Resolution Transmission Electron Microscope (TEM) (Müller-Buschbaum group) High-Temperature Tribometer High-Vacuum Atomic-Force Microscope Hybrid Time-of-Flight Mass-Spectrometry (ToF-SIMS) Impedance Analyzers Infrared Spectroscopy Ion-Beam Etcher Ion-Beam Sputtering Facility Ion-Beam Sputtering Facility Laser Ellipsometry Low-Temperature Scanning Tunnel Microscope / Atomic Force Microscope Magnetron Sputtering Facilities Magnetron Sputtering Facility Mercury Porosimetry Molecular-Beam Epitaxy (MBE) Nanoparticle Analyser Nanotracking Analyser NMR Spectroscopy Not-stirred Pressure Vessel Photoelectron Spectroscopy Photolithography Photovoltaics and Impedance Analyzer Physisorption Autosorb Physisorption Quadrasorb Plasma-Focused-Ion-Beam Scanning Electron Microscopy (PFIB-SEM) Polarimetry Powder X-Ray Diffraction (XRD) PANalytical X’Pert PRO (Müller-Buschbaum group) Powder X-Ray Diffraction (XRD) STOE Stadi P - Station 1 (Müller-Buschbaum group) Powder X-Ray Diffraction (XRD) STOE Stadi P - Station 2 (Müller-Buschbaum group) Powder X-Ray Diffraction (XRD) (Janek group) Powder XRD (Table Diffractometer) Profilometer Pulsed Laser Deposition (PLD) Raman Microscope Raman Microscope Reactive-Ion Etcher Reactor for Microwave Synthesis Room-Temperature Tribometer Semiconductor Analyzer Single crystal X-ray diffraction (XRD) BRUKER D8 Venture - Station 1 (Müller-Buschbaum group) Single crystal X-ray diffraction (XRD) BRUKER D8 Venture - Station 2 (Müller-Buschbaum group) Solar Simulator Spectral Photometer Spin Coater Thermal Vapor Deposition Thin Film X-Ray Diffraction (XRD) (Chatterjee group) Thin-Film X-Ray Diffraction (XRD) (Janek group) Thin-Layer Chromatography Mass Spectrometry (TLC-MS) Time-of-Flight Mass Spectrometer Time-of-Flight Mass-Spectrometry with AFM (ToF-SIMS) Time-resolved Photoluminescence Tribometer for Oil-lubricated Contacts Tuning-Fork Atomic-Force Microscope UHV Scanning Tunneling Microscope Ultra Disc Centrifuge Ultra-high Vacuum Cantilever Atomic-Force Microscope Ultra-high Vacuum Scanning Tunnel Microscope / Atomic Force Microscope Ultrasonic Homogenizer UV Spotlight UV-VIS-NIR-Spectroscopy UV/Vis Spectroscopy X-Ray Diffraction (XRD) (Smarsly group) X-Ray Photoelectron Spectroscopy (XPS)