Collection Janek

Battery Cycling Systems

Contact Angle Gauge

Field-Emission Scanning Electron-Microscopy

Hybrid Time-of-Flight Mass-Spectrometry (ToF-SIMS)

Impedance Analyzers

Ion-Beam Sputtering Facility

Magnetron Sputtering Facility

Plasma-Focused-Ion-Beam Scanning Electron Microscopy (PFIB-SEM)

Powder X-Ray Diffraction (XRD) (Janek group)

Pulsed Laser Deposition (PLD)

Thin-Film X-Ray Diffraction (XRD) (Janek group)

Time-of-Flight Mass-Spectrometry with AFM (ToF-SIMS)

X-Ray Photoelectron Spectroscopy (XPS)