January 2013Since a few months transfer systems for the ToF–SIMS (Time of Flight – Secondary Ion Mass Spectrometry, top of the figure) and the ESCA machine (Electron Spectroscopy for Chemical Analysis, bottom of the figure) are in use allowing the transport of samples from a glove box to the respective machines under protective argon atmosphere. Such a transfer system is necessary for the unbiased surface analysis of reactive materials like lithium and sodium, which are used as anode materials in secondary batteries. Moreover, it is useful for experiments which require very clean surfaces, e.g. for UPS (Ultraviolet Photoelectron Spectroscopy) analysis of metal oxide semiconductors. (Picture submitted by Hauke Metelmann)https://www.uni-giessen.de/en/faculties/f08/departments/physchem/janek/gallerypotm/pom2013/january-2013/viewhttps://www.uni-giessen.de/@@site-logo/logo.png
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January 2013
Since a few months transfer systems for the ToF–SIMS (Time of Flight – Secondary Ion Mass Spectrometry, top of the figure) and the ESCA machine (Electron Spectroscopy for Chemical Analysis, bottom of the figure) are in use allowing the transport of samples from a glove box to the respective machines under protective argon atmosphere. Such a transfer system is necessary for the unbiased surface analysis of reactive materials like lithium and sodium, which are used as anode materials in secondary batteries. Moreover, it is useful for experiments which require very clean surfaces, e.g. for UPS (Ultraviolet Photoelectron Spectroscopy) analysis of metal oxide semiconductors. (Picture submitted by Hauke Metelmann)
