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August 2014

The picture shows a scanning electron microscopy image of a ceria (CeO2) thin film, deposited by pulsed laser deposition (PLD) on a sapphire (Al2O3) single crystal substrate. An interdigital platinum electrode, structured by photolithography, contacts the ceria thin film. The picture shows a cross section through the different layers.We use these layer systems to determine the conductivity of the mixed conductor ceria at different temperatures and gas atmospheres using electrochemical impedance spectroscopy. From these data, we can draw conclusions about the transport properties of the ceria thin films. As it is possible to prepare thin films with a well-defined morphology, this model system allows us to investigate the influence of the morphology on the transport properties of CeO2, representative for a wide variety of polycrystalline, mixed conductors. (Picture submitted by Matthias Kleine-Boymann.)

August 2014
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