May 2015XPS (X-ray Photoelectron Spectroscopy) and ToF–SIMS (Time of Flight – Secondary Ion Mass Spectrometry) are complementary techniques to examine the surface available in the RG Janek. The figure shows the spatial distribution of the elemental concentrations (100 µm x 100 µm x ~10 nm) observed via SIMS and the according XPS detail spectra of those elements. As it can be seen a lithium sulfide layer (bottom left) is formed on top of a lithium substrate (top left). At the interface sulfur is bonded to oxygen (top right) originating from reaction of sulfur with the native oxygen layer of the lithium substrate. The whole layer system together with the phase composition, calculated out of the XPS spectra, is depicted at the bottom right. Since the analyzing depth of XPS is about 10 nm the thickness of the sulfur layer can be expected to be a few nanometers because of the high lithium metal content in the Li1s XPS spectrum. (Picture submitted by Hauke Metelmann)https://www.uni-giessen.de/en/faculties/f08/departments/physchem/janek/gallerypotm/pom2015/PoM0515/viewhttps://www.uni-giessen.de/@@site-logo/logo.png
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May 2015
XPS (X-ray Photoelectron Spectroscopy) and ToF–SIMS (Time of Flight – Secondary Ion Mass Spectrometry) are complementary techniques to examine the surface available in the RG Janek. The figure shows the spatial distribution of the elemental concentrations (100 µm x 100 µm x ~10 nm) observed via SIMS and the according XPS detail spectra of those elements. As it can be seen a lithium sulfide layer (bottom left) is formed on top of a lithium substrate (top left). At the interface sulfur is bonded to oxygen (top right) originating from reaction of sulfur with the native oxygen layer of the lithium substrate. The whole layer system together with the phase composition, calculated out of the XPS spectra, is depicted at the bottom right. Since the analyzing depth of XPS is about 10 nm the thickness of the sulfur layer can be expected to be a few nanometers because of the high lithium metal content in the Li1s XPS spectrum. (Picture submitted by Hauke Metelmann)
