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August 2019

Atomic Force Microscopy (AFM) is a method of characterizing a sample surface by passing a tip close to the surface to be examined. By measuring the atomic forces between the tip and the surface by means of the deflection of the tip, it is possible to obtain information about the topography of the surface or to determine the magnetic and chemical properties of the surface. The picture on the left shows the topography of a cathode for lithium-ion batteries investigated by AFM, in which as active material secondary particles of Li(Ni,Co,Mn)O2 with a diameter of a few micrometers are embedded in carbon. In the right image, an electrically conductive tip was used during the AFM measurement to examine the electrical conductivity of the cathode at the surface. Clearly recognizable is the impact of carbon as conductive additive, since an electrical current is measured mainly in the region, where carbon is found. (Picture submitted by Miguel Wiche and Matthias Elm)

August 2019
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